Secondary ionization
| IUPAC RECOMMENDATIONS 2013 |
| Secondary ionization |
|---|
| Process in which ions are ejected from a sample surface as a result of bombardment by a primary beam of atoms or ions. |
| Related Term(s): secondary ion mass spectrometry (SIMS) |
| Reference(s):
IUPAC. Compendium of Chemical Terminology, 2nd ed. (the Gold Book). Compiled by A. D. McNaught and A.Wilkinson. Blackwell Scientific Publications, Oxford (1997). XML on-line corrected version: http://goldbook.iupac.org (2006-) created by M. Nic, J. Jirat, B. Kosata; updates compiled by A. Jenkins. |
| From Definitions of Terms Relating to Mass Spectrometry (IUPAC Recommendations 2013); DOI: 10.1351/PAC-REC-06-04-06 © IUPAC 2013. |
Gold Book
| GOLD BOOK DEFINITION
IUPAC. Compendium of Chemical Terminology, 2nd ed. (the Gold Book). Compiled by A. D. McNaught and A.Wilkinson. Blackwell Scientific Publications, Oxford (1997). |
| Secondary ionization |
|---|
|
http://goldbook.iupac.org/S05522.html The process in which ions are ejected from a sample surface (which may be a solid or substrate dissolved in a solvent matrix) as a result of bombardment by a primary beam of atoms or ions. Source: PAC, 1991, 63, 1541 (Recommendations for nomenclature and symbolism for mass spectroscopy (including an appendix of terms used in vacuum technology). (Recommendations 1991)) on page 1548 |
| IUPAC Gold Book |
| Index of Gold Book Terms |
