Secondary electron

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IUPAC RECOMMENDATIONS 2013

K. K. Murray, R. K. Boyd, M. N. Eberlin, G. J. Langley, L. Li and Y. Naito, Pure Appl. Chem., 2013, 85, 1515-1609.

Secondary electron
Electrons ejected from a sample surface as a result of bombardment by a primary beam of atoms, ions, electrons, or photons.
Related Term(s):
Reference(s):

M. Van Gorkom, R. E. Glick. Int. J. Mass Spectrom. Ion Phys. 4, 203 (1970). (http://dx.doi.org/10.1016/0020-7381(70)85038-0 )

Definitions of Terms Relating to Mass Spectrometry (IUPAC Recommendations 2013); DOI: 10.1351/PAC-REC-06-04-06 © IUPAC 2013.


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