Static secondary ion mass spectrometry

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Static secondary ion mass spectrometry (SSIMS)
Method of secondary ion mass spectrometry using low current densities for analysis of sample surface components, in contrast with dynamic secondary ion mass spectrometry, which is used for analysis of components in the depth direction.
Note: When the sample is an organic molecule in solid form the term is often changed to organic SIMS or molecular SIMS.
Related Term(s):

H. A. Donsig, J. C. Vickerman. J. Chem. Soc., Faraday Trans. 93, 2755 (1997). ( )

From Definitions of Terms Relating to Mass Spectrometry (IUPAC Recommendations 2013); DOI: 10.1351/PAC-REC-06-04-06 © IUPAC 2013.

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