IUPAC Task Group MS Terms Second Draft: Difference between revisions

From MS Terms
(→‎Terms: A-C)
m (→‎Terms: D-F)
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*[[Desorption Electrospray Ionization]]
*[[Desorption Electrospray Ionization]]
*[[Desorption/Ionization]]
*[[Desorption/Ionization]]
*[[Desorption/Ionization on Silicon]]
*[[Direct Insertion Probe]]
*[[Direct Insertion Probe]]
*[[Direct Liquid Introduction]]
*[[Direct Liquid Introduction]]
Line 82: Line 81:
*[[Distonic Ion]]
*[[Distonic Ion]]
*[[Double-Focusing Mass Spectrometer]]
*[[Double-Focusing Mass Spectrometer]]
*[[Dynamic Fields Mass Spectrometer]]
*[[Dynamic Field Mass Spectrometer]]
*[[dynamic reaction cell]]
*[[Dynamic Secondary Ionization]]
*[[Dynamic Secondary Ionization]]
*[[Dynode]]
*[[Einzel Lens]]
*[[Einzel Lens]]
*[[electric sector]]
*[[Electron Affinity]]
*[[Electron Affinity]]
*[[Electron Attachment Ionization]]
*[[Electron Attachment Ionization]]
*[[Electron Capture Dissociation]]
*[[Electron Capture Dissociation]]
*[[Electron Energy]]
*[[Electron Energy]]
*[[Electron Induced Excitation in Organics]]
*[[Electron Ionization]]
*[[Electron Ionization]]
*[[Electron Multiplier]]
*[[Electron Volt]]
*[[Electron Volt Electrospray Ionization]]
*{{Electrospray Ionization]]
*[[Electrostatic Energy Analyzer]]
*[[Electrostatic Energy Analyzer]]
*[[E/2 Mass Spectrum]]
*[[E/2 Mass Spectrum]]
Line 108: Line 107:
*[[Fission Fragment Ionization]]  
*[[Fission Fragment Ionization]]  
*[[Fixed Product Ion Scan]]
*[[Fixed Product Ion Scan]]
*[[Focal Plane Collector]]
*[[Focal Plane Detector]]
*[[Forward Library Search]]
*[[Forward Library Search]]
*[[Fourier Transform Ion Cyclotron Resonance Mass Spectrometer]]
*[[Fourier Transform Ion Cyclotron Resonance Mass Spectrometer]]
*[[Fragment Ion]]
*[[Fragment Ion]]
*[[Fringing Field]]
*[[Fringe Field]]
*[[Glow Discharge Ionization]]
*[[Glow Discharge Ionization]]
*[[Gridless Reflectron]]
*[[Gridless Reflectron]]

Revision as of 21:23, 2 August 2006