Post-source decay: Difference between revisions

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{{Def2|
{{Final
Technique specific to [[reflectron]] [[time-of-flight mass spectrometers]] where [[product ion]]s of [[metastable transitions]] or [[collision-induced dissociation]]s generated in the drift tube prior to entering the [[reflectron]] are ''[[m/z]]'' separated to yield [[product ion]] spectra.
|acronym=([[PSD]])
|def=Technique specific to [[reflectron]] [[time-of-flight mass spectrometer]]s where [[product ion]]s of metastable transitions or [[collision-induced dissociation]]s generated in the flight tube prior to entering the reflectron are separated according to ''[[m/z]]'' to yield [[product ion]] spectra.
|rel=
|ref=B. Spengler, D. Kirsch, R. Kaufmann. J. Phys. Chem. 96, 9678 (1992). (http://dx.doi.org/10.1021/j100203a022 )
}}
}}
{{Disc}}
== Related Terms ==
*[[Reflectron]]
*[[CID]]
[[Category:Reactions]]
[[Category:Reactions]]

Latest revision as of 23:19, 7 January 2014

IUPAC RECOMMENDATIONS 2013
Post-source decay (PSD)
Technique specific to reflectron time-of-flight mass spectrometers where product ions of metastable transitions or collision-induced dissociations generated in the flight tube prior to entering the reflectron are separated according to m/z to yield product ion spectra.
Related Term(s):
Reference(s):

B. Spengler, D. Kirsch, R. Kaufmann. J. Phys. Chem. 96, 9678 (1992). (http://dx.doi.org/10.1021/j100203a022 )

From Definitions of Terms Relating to Mass Spectrometry (IUPAC Recommendations 2013); DOI: 10.1351/PAC-REC-06-04-06 © IUPAC 2013.

Index of Recommended Terms