Secondary ion mass spectrometry
From MS Terms
IUPAC RECOMMENDATIONS 2013 |
Secondary ion mass spectrometry |
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Technique in which a focused beam of primary ions produces secondary ions by sputtering from a solid surface. The secondary ions are analyzed by mass spectrometry. |
Related Term(s): dynamic secondary ion mass spectrometry (DSIMS) |
Reference(s):
A. Benninghoven, B. Hagenhoff, E. Niehuis. Anal. Chem. 65, 630A (1993). |
From Definitions of Terms Relating to Mass Spectrometry (IUPAC Recommendations 2013); DOI: 10.1351/PAC-REC-06-04-06 © IUPAC 2013. |