Difference between revisions of "Secondary neutral mass spectrometry"

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|def=[[Mass spectrometry]] technique in which neutral species ejected from a sample surface as a result of bombardment by a primary beam of atoms or [[ion]]s are ionized, most often by [[photoionization]], prior to analysis.
 
|def=[[Mass spectrometry]] technique in which neutral species ejected from a sample surface as a result of bombardment by a primary beam of atoms or [[ion]]s are ionized, most often by [[photoionization]], prior to analysis.
 
|rel=[[secondary ion mass spectrometry]] ([[SIMS]])
 
|rel=[[secondary ion mass spectrometry]] ([[SIMS]])
|ref=
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|ref=H. Oechsner, W. Gerhard. Phys. Lett. A 40, 211 (1972). (http://dx.doi.org/10.1016/0375-9601(72)90660-3 )
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D. Lipinsky, R. Jede, O. Ganschow, A. Benninghoven. J. Vac. Sci. Technol. 3, 2007 (1985).
 
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Latest revision as of 17:11, 8 January 2014

IUPAC RECOMMENDATIONS 2013
Secondary neutral mass spectrometry (SNMS)
Mass spectrometry technique in which neutral species ejected from a sample surface as a result of bombardment by a primary beam of atoms or ions are ionized, most often by photoionization, prior to analysis.
Related Term(s): secondary ion mass spectrometry (SIMS)
Reference(s):

H. Oechsner, W. Gerhard. Phys. Lett. A 40, 211 (1972). (http://dx.doi.org/10.1016/0375-9601(72)90660-3 )

D. Lipinsky, R. Jede, O. Ganschow, A. Benninghoven. J. Vac. Sci. Technol. 3, 2007 (1985).

From Definitions of Terms Relating to Mass Spectrometry (IUPAC Recommendations 2013); DOI: 10.1351/PAC-REC-06-04-06 © IUPAC 2013.

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